White Paper: Optical Vector Network Analyzer For Single Scan Measurements Of Loss, Group Delay And Polarization Mode Dispersion

The Jones matrix (JM) or linear transfer function (TF) of a fiber-coupled component, when measured as a function of frequency, contains all of the information required to predict final component performance (loss, dispersion, polarization effects, etc.).

In this white paper we describe a novel interferometric technique for single-scan, high-resolution spectral measurements of the TF of an optical component. In addition, we demonstrate mathematically how the TF is obtained from this measurement apparatus. We then show that highly accurate spectral amplitude and phase information can be extracted from the TF in the form of polarization-averaged group delay (GD), polarization mode dispersion (PMD), insertion loss (IL), and polarization dependent loss (PDL).

Data is presented demonstrating greater than 100 dB, 80 dB and 60 dB dynamic range for the polarization-averaged IL, GD and PMD measurements, respectively. The elimination of the need for multiple wavelength scans in combination with the accurate and sensitive nature of the interferometric measurement technique yields an instrument ideally suited for high resolution metrology of passive optical components for high bit-rate network applications (e.g. tunable dispersion compensators, fiber Bragg gratings, arrayed waveguide gratings, etc.).