LIV Test System
This LIV (Light intensity-Current-Voltage) Test System was designed for the testing of Laser Diode Modules (LDMs) used in fiber-optic telecom applications
N/Aight intensity-Current-Voltage) Test System was designed for the testing of Laser Diode Modules (LDMs) used in fiber-optic telecom applications. A variety of test and measurement capabilities can be configured based on the instruments selected for the test system.
A typical system consists of a Model 2400 Digital SourceMeter, the new Model 2510 TEC SourceMeter , and two Model 6517A Electrometers:
- The Model 2400 uses SourceMeter architecture, which offers advantages over discrete instruments. Tight integration of source and measurement functions improves measurement speed and precision, conserves rack space, and minimizes software overhead. The Model 2400 is used to drive the laser diode, and as a modulator bias source in LDMs employing an integrated modulator.
- The Model 2510 TEC SourceMeter provides a combination of source, measurement, and temperature control capabilities. Its software-based, digital P-I-D (Proportional-Integral-Derivative) control loop provides temperature stability (typically ±0.005°C or better) and improved confidence in test data as compared to less sophisticated P-I loops used in other instruments. The Model 2510's has 50 watt output, programmable power, current and temperature limits. An AC ohms function has been incorporated to provide for a quick low-level resistance measurement to detect any mechanical damage to the TEC during assembly. The 2510 provides sensor resistance setpoint capability which more closely approximates the actual end use in a telecom optical network.
- Dual 6517A Electrometers form an instrument platform for measurement of light intensity during LIV testing of laser diode modules. Typically, one Model 6517A is used to reverse bias and measure the output of the LDM back-detector photodiode, while the second can be used with a suitable detector to measure fiber-coupled light intensity of the LDM. Its 100VDC source capability can be used to bias the latest generation photo detectors, including avalanche types (APDs).
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